Nanometrics Incorporated Profile

Nanometrics Incorporated is engaged in the design, manufacture, marketing, sale and support of thin film, optical critical dimension and overlay dimension metrology systems. The Company's measurement systems use microscope-based, non-contact spectroscopic reflectometry. Some of its systems provide complementary spectroscopic ellipsometry to measure the thickness and optical characteristics of films on a variety of substrates. In addition, the Company offers both integrated and standalone optical critical metrology systems to measure critical dimensions of patterns on semiconductor wafers. Nanometrics also manufactures a line of optical overlay registration systems that are used to determine the alignment accuracy of successive layers of semiconductor patterns on wafers in the photolithography process. The Company's products are comprised of three groups: automated standalone systems, integrated systems and tabletop systems. For the thirteen weeks ended 1 April 2006, Nanometrics Incorporated's revenues decreased 19% to $19M. Net loss totaled $1.3M vs. an income of $2.5M. Revenues reflect a decrease in automated system sales. Net loss reflects an increase in general & administrative expenses due to higher legal expenses, higher charge for professional services associated with compliance with regulatory requirements and increased headcount related expenses.